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author:

Lin, He (Lin, He.) [1] | Ye, Yun (Ye, Yun.) [2] (Scholars:叶芸) | Xiao, Xiaojing (Xiao, Xiaojing.) [3] | Yang, Fan (Yang, Fan.) [4] | Lu, Peimin (Lu, Peimin.) [5] | Guo, Tailiang (Guo, Tailiang.) [6]

Indexed by:

EI PKU CSCD

Abstract:

The dielectric films, to be used in fabrication of field emission display, were deposited by screen printing on glass substrates. The impacts of sample preparation, including the sintering conditions, numbers of screen-printing and sintering times, and film thickness, on its insulation property was studied. The microstructures of the films were characterized with scanning electron microscopy and conventional surface probes. The results show that the repeated sintering significantly improves the insulation property. For instance, when films were sintered twice in two different stages, the breakdown voltage of a 34 μm thick films was found to be 421 V, accompanied by negligible leakage current. When it comes to the conduction mechanisms, in a low field, Ohm's law works;whereas in a high field, Schottky emission dominates.

Keyword:

Dielectric films Insulation Scanning electron microscopy Screen printing Sintering Substrates Thick films

Community:

  • [ 1 ] [Lin, He]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Ye, Yun]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Xiao, Xiaojing]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Yang, Fan]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Lu, Peimin]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 6 ] [Guo, Tailiang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

Year: 2012

Issue: 2

Volume: 32

Page: 104-108

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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