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author:

Li, Wenguo (Li, Wenguo.) [1] | Li, Hao (Li, Hao.) [2] | Zhang, Hao (Zhang, Hao.) [3]

Indexed by:

EI Scopus SCIE

Abstract:

This paper investigates the overall fitting accuracy of the light plane can be improved by changing the relative distance between camera and laser, altering the projection direction of the light stripe and increasing the number of extracted light stripe in the multi-line structure light measurement system. Firstly, a multi-line structured light three-dimensional measurement system platform is built, and the existing calibration plate is modified according to the requirements of the experimental design. Then, laser stripes are projected onto a blank area in the checkerboard to facilitate the extraction of the centerline of the light stripe. Moreover, the three-dimensional (3D) point cloud transformed from centerline of each stripe is used to fit into a plane by a random sample consensus algorithm (RANSAC). Finally, the influence of different experiment methods on the overall fitting accuracy of the light plane is observed. Experiments illustrate that the proposed experimental methods can reduce the relative error of the overall fitting result of the mull-line structured light plane by more than two times, and the overall calibration accuracy of the light plane is improved in terms of the error of angle between the calibrated light planes.

Keyword:

Accuracy analysis Calibration light plane Multi-line structured light

Community:

  • [ 1 ] [Li, Wenguo]Kunming Univ Sci & Technol, Fac Mech & Elect Engn, Kunming 650500, Yunnan, Peoples R China
  • [ 2 ] [Li, Hao]Kunming Univ Sci & Technol, Fac Mech & Elect Engn, Kunming 650500, Yunnan, Peoples R China
  • [ 3 ] [Zhang, Hao]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • [Li, Wenguo]Kunming Univ Sci & Technol, Fac Mech & Elect Engn, Kunming 650500, Yunnan, Peoples R China

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Related Keywords:

Source :

OPTIK

ISSN: 0030-4026

Year: 2020

Volume: 207

2 . 4 4 3

JCR@2020

3 . 1 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:115

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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