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author:

Lan, Sheng (Lan, Sheng.) [1] (Scholars:兰生) | Hu, Yue-Qun (Hu, Yue-Qun.) [2] | Kuo, Cheng-Chien (Kuo, Cheng-Chien.) [3]

Indexed by:

EI Scopus SCIE

Abstract:

This paper aims to use only one sensor to achieve better PD fault location of power cables in a low signal-to-noise ratio (SNR) noise environment. Therefore, an improved phase difference (IPD) method based on one sensor is used to estimate the PD fault location of power cables. This method has a good advantage of using only the first two PD peaks, which is suitable for location estimation in the low SNR noise environment. The white Gaussian noise is regarded as background noise to simulate the noise environment. In order to enhance the accuracy of the IPD method in the noisy environment, a new denoising algorithm combining high-order statistics (HOS) criterion and generalized cross-validation (GCV) thresholding is proposed to process PD signals. The results show the good performance of the proposed denoising algorithm and higher location accuracy of the IPD method in the low SNR noise environment.

Keyword:

Continuous wavelet transforms Estimation Fault location general cross-validation thresholding HOS criterion Noise reduction partial discharges Partial discharges PD location power cable Power cables Signal to noise ratio

Community:

  • [ 1 ] [Lan, Sheng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou, Fujian, Peoples R China
  • [ 2 ] [Hu, Yue-Qun]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou, Fujian, Peoples R China
  • [ 3 ] [Kuo, Cheng-Chien]Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei, Taiwan

Reprint 's Address:

  • [Kuo, Cheng-Chien]Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei, Taiwan

Email:

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Source :

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION

ISSN: 1070-9878

Year: 2019

Issue: 5

Volume: 26

Page: 1612-1619

2 . 5 5 4

JCR@2019

2 . 9 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:150

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 10

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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