The　mechanisms　of　action　of　low-energy　electrons　(LEEs)　generated　in　large　quantities　by　ionizing　radiation　constitute　an　essential　element　of　our　understanding　of　early　events　in　radiolysis　and　radiobiology.　We　present　the　2-20　eV　electron　energy　dependence　of　the　yields　of　base　damage　(BD),　BD-related　cross-links　(CLs),　and　non-double-strand　break　(NDSB)　clustered　damage　induced　in　DNA.　These　new　yield　functions　are　generated　by　the　impact　of　LEEs　on　plasmid　DNA　films.　The　damage　is　analyzed　by　gel　electrophoresis　with　and　without　enzyme　treatment.　Maxima　at　5　and　10　eV　in　BDs　and　BD-related　CLs　yield　functions,　and　two　others,　at　6　and　10　eV,　in　those　of　NDSB　clustered　damage　are　ascribed　to　core-excited　transient　anions　that　decay　into　bond-breaking　channels.　The　mechanism　causing　all　types　of　DNA　damages　can　be　attributed　to　the　capture　of　a　single　electron　by　a　base　followed　by　multiple　different　electron　transfer　pathways.