The　optical　voltage　sensor　(OVS)　based　on　the　Pockels　effect　and　its　light　intensity　detection　mode　has　a　limitation　of　half-wave　voltage　and　optical　power　correlation.　In　this　paper,　a　new　type　of　OVS　which　can　achieve　linear　measurements　of　a　wide　range　electrooptic　(EO)　phase　delay　was　proposed.　It　uses　a　crystal　wedge　to　convert　EO　phase　delay　to　a　displacement　image　of　light　stripes,　and　an　image　acquisition　system　that　captures　the　spot　and　calculates　the　displacement.　Mathematical　derivation　regarding　the　linear　relationship　between　the　stripes　displacement　and　phase　delay　is　given;　a　suitable　image　sensor　and　a　stripe　location　algorithm　are　selected.　Experimental　verification　is　carried　out,　and　several　key　issues　are　discussed.　Compared　with　light　intensity　detection　mode,　the　experimental　results　show　that　this　measuring　mode　is　independent　of　light　source.　An　imaging　mode　also　offers　a　large　dynamic　range　and　a　good　linear　measurement　of　EO　phase　delay　in　the　range　of　291　degrees　with　a　measurement　error　of　less　than　0.5%.　This　mode　is　not　limited　by　the　half-wave　voltage　of　crystal.　Temperature　drift　errors　on　measurement　results　are　also　reduced.