The　measurement　mode　of　the　existing　optical　voltage　transducer　(OVT)　is　mostly　based　on　light　intensity　detection.　In　such　a　way,　the　OVT　has　some　big　issues,　such　as　a　light　intensity　dependency,　a　temperature　drift,　an　additional　birefringence　in　the　crystal　and　a　half-wave　voltage　limitation　to　its　measurement　range.　A　new　OVT　based　on　conoscopic　interference　and　bi-dimensional　position　sensitive　detector　(PSD)　is　proposed　in　the　paper,　which　can　convert　the　electro-optical　phase　delay　of　the　crystal　to　a　rotation　angle　of　spot　pattern,　and　therefore,　a　high　voltage　can　be　measured　by　the　PSD.　Compared　with　the　existing　OVT,　the　measurement　mode　of　the　new　one　is　independent　of　light　intensity,　capable　of　measuring　the　electro-optical　phase　delay　from　0　degrees　to　180　degrees　linearly　and　directly,　and　has　a　wide　measurement　range　with　no　restriction　of　the　half-wave　voltage.　The　rotation　angle　of　the　spot　pattern　is　positioned　by　a　bi-dimensional　PSD　and　the　new　OVT　has　a　good　linearity　better　than　0.5%.