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Abstract:
Extensive density functional theoretical (DFT) and ab initio [CCSD(T)] calculations were combined to investigate the geometric and electronic structure of a series of dinuclear hafnium oxide clusters, Hf2On-/0 (n=1 similar to 6). DFT calculations were performed to search for the lowest energy structures for both the anionic clusters and the neutral counterparts. The search for the global minima was performed using analytical gradients with the Stuttgart relativistic small core potential and the valence basis sets augmented with two f-type and one g-type polarization functions for Hf and the aug-cc-pVTZ basis set for oxygen. The relative energies of the low-lying structures (within ca. 0.35 eV) were further evaluated via single-point calculations at the coupled cluster [CCSD(T)] level with the Hf/Stuttgart+2flg/O/aug-cc-pVTZ basis sets at the B3LYP geometries. Generalized Koopmans' theorem (GKT) was applied to predict VDEs and simulate the anion photoelectron spectra (PES). The trends of structural evolution and the behavior of sequential oxidation of the Hf2On (n= 1 similar to 6) clusters were observed. For the anionic species, starting from the C-2v triangular structure Hf2O- the next O atom in the Hf2O2- cluster was again bridge-bonded, forming a rhombus structure. The third O atom occupied the terminal site. The fourth O atom favored the bridging site and the fifth O atom occupied the terminal site. In Hf2O6-, the additional O atom was bonded to a terminal site. Molecular orbital analyses were performed to elucidate the chemical bonding and the structural evolution in Hf(2)On(-) (n= 1 similar to 4) clusters. Spin density analyses revealed oxygen radical, diradical and superoxide characters in the oxygen-rich clusters, except for the singlet Hf2O5 cluster. We showed that Hf2O3 contains a localized Hf2+ site, which can readily react with O-2 to form the Hf2O5 cluster. The Hf2O6 -and Hf2O6 clusters, which can be viewed to be formed by the interaction of Hf2O4-/0 and O-2, may be utilized as molecular models to understand dioxygen activation on Hf2O4- and Hf2O4 clusters.
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ACTA CHIMICA SINICA
ISSN: 0567-7351
CN: 31-1320/O6
Year: 2016
Issue: 12
Volume: 74
Page: 1009-1017
2 . 1 3 1
JCR@2016
1 . 7 0 0
JCR@2023
ESI Discipline: CHEMISTRY;
ESI HC Threshold:235
JCR Journal Grade:2
CAS Journal Grade:4
Cited Count:
WoS CC Cited Count: 1
SCOPUS Cited Count: 1
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 1
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