Absolute　cross　sections　(CSs)　for　the　interaction　of　low　energy　electrons　with　condensed　macromolecules　are　essential　parameters　to　accurately　model　ionizing　radiation　induced　reactions.　To　determine　CSs　for　various　conformational　DNA　damage　induced　by　2-20　eV　electrons,　we　investigated　the　influence　of　the　attenuation　length　(AL)　and　penetration　factor　(f)　using　a　mathematical　model.　Solid　films　of　super-coiled　plasmid　DNA　with　thicknesses　of　10,　15　and　20　nm　were　irradiated　with　4.6,　5.6,　9.6　and　14.6　eV　electrons.　DNA　conformational　changes　were　quantified　by　gel　electrophoresis,　and　the　respective　yields　were　extrapolated　from　exposure-response　curves.　The　absolute　CS,　AL　and　f　values　were　generated　by　applying　the　model　developed　by　Rezaee　et　al.　The　values　of　AL　were　found　to　lie　between　11　and　16　nm　with　the　maximum　at　14.6　eV.　The　absolute　CSs　for　the　loss　of　the　supercoiled　(LS)　configuration　and　production　of　crosslinks　(CL),　single　strand　breaks　(SSB)　and　double　strand　breaks　(DSB)　induced　by　4.6,　5.6,　9.6　and　14.6　eV　electrons　are　obtained.　The　CSs　for　SSB　are　smaller,　but　similar　to　those　for　LS,　indicating　that　SSB　are　the　main　conformational　damage.　The　CSs　for　DSB　and　CL　are　about　one　order　of　magnitude　smaller　than　those　of　LS　and　SSB.　The　value　of　f　is　found　to　be　independent　of　electron　energy,　which　allows　extending　the　absolute　CSs　for　these　types　of　damage　within　the　range　2-20　eV,　from　previous　measurements　of　effective　CSs.　When　comparison　is　possible,　the　absolute　CSs　are　found　to　be　in　good　agreement　with　those　obtained　from　previous　similar　studies　with　double-stranded　DNA.　The　high　values　of　the　absolute　CSs　of　4.6　and　9.6　eV　provide　quantitative　evidence　for　the　high　efficiency　of　low　energy　electrons　to　induce　DNA　damage　via　the　formation　of　transient　anions.