• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Sa, Baisheng (Sa, Baisheng.) [1] (Scholars:萨百晟) | Li, Yan-Ling (Li, Yan-Ling.) [2] | Sun, Zhimei (Sun, Zhimei.) [3] | Qi, Jingshan (Qi, Jingshan.) [4] | Wen, Cuilian (Wen, Cuilian.) [5] (Scholars:温翠莲) | Wu, Bo (Wu, Bo.) [6] (Scholars:吴波)

Indexed by:

EI Scopus SCIE

Abstract:

Artificial monolayer black phosphorus, so-called phosphorene, has attracted global interest with its distinguished anisotropic, optoelectronic, and electronic properties. Here, we unraveled the shear-induced direct-to-indirect gap transition and anisotropy diminution in phosphorene based on first-principles calculations. Lattice dynamic analysis demonstrates that phosphorene can sustain up to 10% applied shear strain. The bandgap of phosphorene experiences a direct-to-indirect transition when 5% shear strain is applied. The electronic origin of the direct-to-indirect gap transition from 1.54 eV at ambient conditions to 1.22 eV at 10% shear strain for phosphorene is explored. In addition, the anisotropy diminution in phosphorene is discussed by calculating the maximum sound velocities, effective mass, and decomposed charge density, which signals the undesired shear-induced direct-to-indirect gap transition in applications of phosphorene for electronics and optoelectronics. On the other hand, the shear-induced electronic anisotropy properties suggest that phosphorene can be applied as the switcher in nanoelectronic applications.

Keyword:

ab initio calculations black phosphorus electron effective mass electronic structure shear strain

Community:

  • [ 1 ] [Sa, Baisheng]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou 350108, Peoples R China
  • [ 2 ] [Wen, Cuilian]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou 350108, Peoples R China
  • [ 3 ] [Wu, Bo]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou 350108, Peoples R China
  • [ 4 ] [Li, Yan-Ling]Jiangsu Normal Univ, Sch Phys & Elect Engn, Xuzhou 221116, Peoples R China
  • [ 5 ] [Qi, Jingshan]Jiangsu Normal Univ, Sch Phys & Elect Engn, Xuzhou 221116, Peoples R China
  • [ 6 ] [Sun, Zhimei]Beihang Univ, Sch Mat Sci & Engn, Beijing 100191, Peoples R China
  • [ 7 ] [Sun, Zhimei]Beihang Univ, Int Res Inst Multidisciplinary Sci, Ctr Integrated Computat Mat Engn, Beijing 100191, Peoples R China

Reprint 's Address:

  • 萨百晟

    [Sa, Baisheng]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou 350108, Peoples R China

Show more details

Related Keywords:

Source :

NANOTECHNOLOGY

ISSN: 0957-4484

Year: 2015

Issue: 21

Volume: 26

3 . 5 7 3

JCR@2015

2 . 9 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:335

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 44

SCOPUS Cited Count: 41

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Online/Total:160/10060010
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1