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author:

Yao, Haizi (Yao, Haizi.) [1] | Zhong, Shuncong (Zhong, Shuncong.) [2] (Scholars:钟舜聪) | Tu, Wanli (Tu, Wanli.) [3]

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Abstract:

We investigated the spoof surface plasmon polaritons (SSPPs) on 1D grooved metal surface for terahertz sensing of refractive index of the filling analyte through a prism-coupling attenuated total reflection setup. From the dispersion relation analysis and the finite element method-based simulation, we revealed that the dispersion curve of SSPP got suppressed as the filling refractive index increased, which cause the coupling resonance frequency redshifting in the reflection spectrum. The simulated results for testing various refractive indexes demonstrated that the incident angle of terahertz radiation has a great effect on the performance of sensing. Smaller incident angle will result in a higher sensitive sensing with a narrower detection range. In the meanwhile, the higher order mode SSPP-based sensing has a higher sensitivity with a narrower detection range. The maximum sensitivity is 2.57 THz/RIU for the second-order mode sensing at 45 degrees internal incident angle. The proposed SSPP-based method has great potential for high sensitive terahertz sensing. (C) 2015 AIP Publishing LLC.

Keyword:

Community:

  • [ 1 ] [Yao, Haizi]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 2 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 3 ] [Tu, Wanli]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 4 ] [Zhong, Shuncong]Univ Strathclyde, Dept Naval Architecture Ocean & Marine Engn, Glasgow G4 0LZ, Lanark, Scotland
  • [ 5 ] [Zhong, Shuncong]Fujian Key Lab Med Instrument & Pharmaceut Techno, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • 钟舜聪

    [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China

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Source :

JOURNAL OF APPLIED PHYSICS

ISSN: 0021-8979

Year: 2015

Issue: 13

Volume: 117

2 . 1 0 1

JCR@2015

2 . 7 0 0

JCR@2023

ESI Discipline: PHYSICS;

ESI HC Threshold:200

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 24

SCOPUS Cited Count: 32

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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