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author:

Wang, Weidong (Wang, Weidong.) [1] | Li, Shuai (Li, Shuai.) [2] | Min, Jiaojiao (Min, Jiaojiao.) [3] | Yi, Chenglong (Yi, Chenglong.) [4] | Zhan, Yongjie (Zhan, Yongjie.) [5] | Li, Minglin (Li, Minglin.) [6] (Scholars:李明林)

Indexed by:

EI Scopus SCIE

Abstract:

A molecular dynamics study on nanoindentation experiments is carried out for some single-layer rectangular graphene films with four edges clamped. Typical load-displacement curves are obtained, and the effects of various factors including indenter radii, loading speeds, and aspect ratios of the graphene film on the simulation results are discussed. A formula describing the relationship between the load and indentation depth is obtained according to the molecular dynamics simulation results. Young's modulus and the strength of the single-layer graphene film are measured as about 1.0 TPa and 200 GPa, respectively. It is found that the graphene film ruptured in the central point at a critical indentation depth. The deformation mechanisms and dislocation activities are discussed in detail during the loading-unloading-reloading process. It is observed from the simulation results that once the loading speed is larger than the critical loading speed, the maximum force exerted on the graphene film increases and the critical indentation depth decreases with the increase of the loading speed.

Keyword:

Molecular dynamics simulation Nanoindentation Rectangular graphene film Strength Young's modulus

Community:

  • [ 1 ] [Wang, Weidong]Xidian Univ, Sch Elect & Mech Engn, Xian 710071, Peoples R China
  • [ 2 ] [Li, Shuai]Xidian Univ, Sch Elect & Mech Engn, Xian 710071, Peoples R China
  • [ 3 ] [Min, Jiaojiao]Xidian Univ, Sch Elect & Mech Engn, Xian 710071, Peoples R China
  • [ 4 ] [Yi, Chenglong]Xidian Univ, Sch Elect & Mech Engn, Xian 710071, Peoples R China
  • [ 5 ] [Zhan, Yongjie]Northwest Univ, Dept Phys, Xian 710069, Peoples R China
  • [ 6 ] [Li, Minglin]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • [Wang, Weidong]Xidian Univ, Sch Elect & Mech Engn, Xian 710071, Peoples R China

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Source :

NANOSCALE RESEARCH LETTERS

ISSN: 1931-7573

Year: 2014

Volume: 9

2 . 7 7 9

JCR@2014

5 . 5 0 0

JCR@2023

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 38

SCOPUS Cited Count: 39

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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