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author:

Peng, Kaiping (Peng, Kaiping.) [1] (Scholars:彭开萍) | Mou, Xueping (Mou, Xueping.) [2] | Zeng, Jiawei (Zeng, Jiawei.) [3] | Shaw, Leon L. (Shaw, Leon L..) [4] | Qian, K. -W. (Qian, K. -W..) [5]

Indexed by:

CPCI-S EI Scopus SCIE

Abstract:

Constrained groove pressing (CGP) has been developed to refine grain sizes, and in most cases is conducted under partially constrained conditions. Here we report the first investigation of the Von Mises equivalent strain and its distribution in samples subject to CGP under partially constrained conditions. Using finite element modeling, we show that the value of the equivalent strain and its distribution depend strongly on the constraint condition of CGP. Experiments using an annealed H62 brass confirm the simulation and reveal that the non-uniform strain distribution results in the corresponding non-uniform profile of the grain size and hardness. These findings are of great importance since many CGP are conducted under partially constrained conditions which generate lower equivalent strains than the counterpart under fully constrained conditions. (C) 2010 Elsevier B.V. All rights reserved.

Keyword:

Constrained groove pressing Finite element modeling Grain refinement H62 brass Severe plastic deformation

Community:

  • [ 1 ] [Shaw, Leon L.]Univ Connecticut, Inst Mat Sci, Storrs, CT USA
  • [ 2 ] [Peng, Kaiping]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou, Fujian, Peoples R China
  • [ 3 ] [Mou, Xueping]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou, Fujian, Peoples R China
  • [ 4 ] [Zeng, Jiawei]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou, Fujian, Peoples R China
  • [ 5 ] [Qian, K. -W.]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou, Fujian, Peoples R China

Reprint 's Address:

  • [Shaw, Leon L.]97 N Eagleville Rd, Storrs, CT 06269 USA

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Source :

COMPUTATIONAL MATERIALS SCIENCE

ISSN: 0927-0256

Year: 2011

Issue: 4

Volume: 50

Page: 1526-1532

1 . 5 7 4

JCR@2011

3 . 1 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 32

SCOPUS Cited Count: 40

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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