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author:

Yan, Wenduan (Yan, Wenduan.) [1] | Fu, Gaosheng (Fu, Gaosheng.) [2] | Chen, Guiqing (Chen, Guiqing.) [3] | Cheng, Chaozeng (Cheng, Chaozeng.) [4]

Indexed by:

CPCI-S EI Scopus

Abstract:

Texutre evolution of 1235 aluminum alloy deformed at different strain rates was studied by dynamic thermal-simulated technology with the aid of some modern analytical and testing technique called election backscatter diffraction (EBSD). The results showed that the effect of strain rate on grain boundary and deformation texture of 1235 aluminum alloy was obvious. At deformation temperature for 400 degrees C and distortion for 50%, the value of the maximum density level came to the minimum by 11.489 at the strain rate for 0.01s(-1). The texture was weaker for the grains were less likely to rotate. The relative volume of textures increased as the strain rate increasing. The relative volume of textures was merely 1.95% at strain rate for 0.01s(-1) but ascended to 5.4% at strain rate for 50s(-1).

Keyword:

1235 aluminum alloy deformation texture election backscatter diffraction (EBSD) high-angle grain boundary low-angel grain boundary

Community:

  • [ 1 ] [Yan, Wenduan]Fuzhou Univ, Sch Mat Sci & Engn, Fuzhou 350108, Peoples R China
  • [ 2 ] [Fu, Gaosheng]Fuzhou Univ, Sch Mat Sci & Engn, Fuzhou 350108, Peoples R China
  • [ 3 ] [Chen, Guiqing]Fuzhou Univ, Sch Mat Sci & Engn, Fuzhou 350108, Peoples R China
  • [ 4 ] [Yan, Wenduan]Fujian Commun Technol Coll, Fuzhou 350007, Peoples R China
  • [ 5 ] [Fu, Gaosheng]Fujian Commun Technol Coll, Fuzhou 350007, Peoples R China
  • [ 6 ] [Chen, Guiqing]Fujian Commun Technol Coll, Fuzhou 350007, Peoples R China
  • [ 7 ] [Cheng, Chaozeng]Fujian Commun Technol Coll, Fuzhou 350007, Peoples R China

Reprint 's Address:

  • 颜文煅

    [Yan, Wenduan]Fuzhou Univ, Sch Mat Sci & Engn, Fuzhou 350108, Peoples R China

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Source :

MATERIALS AND DESIGN, PTS 1-3

ISSN: 1022-6680

Year: 2011

Volume: 284-286

Page: 1684-,

Language: English

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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