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author:

Zhao, Liming (Zhao, Liming.) [1] | Wu, Wei (Wu, Wei.) [2] | Shen, Xiaqiang (Shen, Xiaqiang.) [3] | Liu, Qian (Liu, Qian.) [4] | He, Yan (He, Yan.) [5] | Song, Kaiyue (Song, Kaiyue.) [6] | Li, Haohong (Li, Haohong.) [7] | Chen, Zhirong (Chen, Zhirong.) [8]

Indexed by:

EI

Abstract:

Electrically bistable devices play an important role in the next generation of information materials. Plasmonic noble metal nanoparticles (Au and Ag NPs) with diameters 4, which can be attributed to its higher electron tunneling efficiency because of the better dispersity of Au NPs in the MOF matrix. A mechanism regarding the electric-field-induced charge-transfer process assisted by conformational change in the active layer was proposed. © 2019 American Chemical Society.

Keyword:

Charge transfer Electric fields Electron tunneling Metallic matrix composites Metal nanoparticles Metal-Organic Frameworks Optical bistability Organometallics Plasmonic nanoparticles Plasmonics Precious metals

Community:

  • [ 1 ] [Zhao, Liming]College of Chemistry, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 2 ] [Wu, Wei]College of Chemistry, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 3 ] [Shen, Xiaqiang]College of Chemistry, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 4 ] [Liu, Qian]College of Chemistry, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 5 ] [He, Yan]College of Chemistry, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 6 ] [Song, Kaiyue]College of Chemistry, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 7 ] [Li, Haohong]College of Chemistry, Fuzhou University, Fuzhou, Fujian; 350108, China
  • [ 8 ] [Chen, Zhirong]College of Chemistry, Fuzhou University, Fuzhou, Fujian; 350108, China

Reprint 's Address:

  • [li, haohong]college of chemistry, fuzhou university, fuzhou, fujian; 350108, china

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Source :

ACS Applied Materials and Interfaces

ISSN: 1944-8244

Year: 2019

Issue: 50

Volume: 11

Page: 47073-47082

8 . 7 5 8

JCR@2019

8 . 5 0 0

JCR@2023

ESI HC Threshold:236

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 38

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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