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author:

Yin, Yadong (Yin, Yadong.) [1] | Zhang, Lihong (Zhang, Lihong.) [2]

Indexed by:

EI

Abstract:

An ultra-low-power Frequency Shift Keying (FSK) demodulator with frequency-offset tolerance is designed in 0.18 μm Complementary Metal Oxide Semiconductor (CMOS) process. The demodulator employs a period-to-voltage converter to convert the periods of the input FSK-modulated signal into voltage levels continuously while consuming ultra-low power. Moreover, a discrete-time differentiator is adopted to utilize those converted voltages to recover the transmitted data while preventing the carrier-frequency offset from deteriorating the demodulation performance. As the experimental results indicate, the novel demodulator can tolerate carrier frequency variations up to ±200 kHz in the case of 1 Mbps data rate with a modulation index of 0.32. It needs a signal-to-noise ratio of 16.8 dB to achieve 0.1% bit error rate and consumes a current of only about 49.7 μA from a 1.8 V supply. © 2018 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc. © 2018 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.

Keyword:

Bit error rate CMOS integrated circuits Demodulators Frequency allocation Frequency shift keying Metals MOS devices Oxide semiconductors Signal to noise ratio

Community:

  • [ 1 ] [Yin, Yadong]School of Physics and Information Engineering, Fuzhou University, No. 2 Xueyuan Road, University Town, Fuzhou; Fujian, China
  • [ 2 ] [Zhang, Lihong]School of Electronic Information Science, Fujian Jiangxia University, No. 2 Xiyuangong Road, University Town, Fuzhou; Fujian, China

Reprint 's Address:

  • [yin, yadong]school of physics and information engineering, fuzhou university, no. 2 xueyuan road, university town, fuzhou; fujian, china

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Source :

IEEJ Transactions on Electrical and Electronic Engineering

ISSN: 1931-4973

Year: 2019

Issue: 5

Volume: 14

Page: 768-772

0 . 6 6 8

JCR@2019

1 . 0 0 0

JCR@2023

ESI HC Threshold:150

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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