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author:

Lai, Huan Sheng (Lai, Huan Sheng.) [1] | Ryu, Sung Woo (Ryu, Sung Woo.) [2] | Yoon, Kee Bong (Yoon, Kee Bong.) [3] | Lin, Xin Peng (Lin, Xin Peng.) [4]

Indexed by:

EI

Abstract:

Ct is an important parameter in predicting creep crack growth life from the small-scale creep stage to the extensive steady state creep stage. In this paper, weld interface and non-interface creep cracks for compact tension (CT) specimens with heat-affected zone (HAZ) were studied by finite element method (FEM) to systematically research the estimation method of Ct for weld creep cracks. Simulation results showed that Ct of weld interface cracks could be estimated by Yoon’s method. For weld non-interface cracks, Ct under the small-scale and transition creep stages could be exactly estimated by a proposed method. The accuracy of the proposed method was not affected by HAZ, but Yoon’s method was slightly affected by HAZ. © 2016 Informa UK Limited, trading as Taylor & Francis Group.

Keyword:

Crack propagation Creep Heat affected zone

Community:

  • [ 1 ] [Lai, Huan Sheng]Department of Mechanical Engineering, Chung-Ang University, 221 Huksuk Dongjak, Seoul; 156-756, Korea, Republic of
  • [ 2 ] [Lai, Huan Sheng]Currently in School of Chemical Engineering, Fuzhou University, Fuzhou; Fujian; 350-116, China
  • [ 3 ] [Ryu, Sung Woo]Department of Mechanical Engineering, Chung-Ang University, 221 Huksuk Dongjak, Seoul; 156-756, Korea, Republic of
  • [ 4 ] [Yoon, Kee Bong]Department of Mechanical Engineering, Chung-Ang University, 221 Huksuk Dongjak, Seoul; 156-756, Korea, Republic of
  • [ 5 ] [Lin, Xin Peng]System Equipment Division, Ningde Nuclear Power Co. Ltd., 226 Riverside Road, Fuding; Fujian; 355-200, China

Reprint 's Address:

  • [lai, huan sheng]currently in school of chemical engineering, fuzhou university, fuzhou; fujian; 350-116, china;;[lai, huan sheng]department of mechanical engineering, chung-ang university, 221 huksuk dongjak, seoul; 156-756, korea, republic of

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Source :

Materials at High Temperatures

ISSN: 0960-3409

Year: 2016

Issue: 6

Volume: 33

Page: 596-603

0 . 8 0 2

JCR@2016

1 . 0 0 0

JCR@2023

ESI HC Threshold:324

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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