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author:

Jin, Tao (Jin, Tao.) [1] (Scholars:金涛) | Chen, Yiyang (Chen, Yiyang.) [2] | You, Shengqiang (You, Shengqiang.) [3]

Indexed by:

EI Scopus PKU CSCD

Abstract:

The spectral leakage has great influence on the performance of dielectric loss angle measurement when using fast Fourier transform (FFT) algorithm. Based on the analysis of the spectrum leakage effect of FFT algorithm, an improved FFT method combined Nuttall window with five-point polynomial transform to detect dielectric loss angle was presented in this paper. Since Nuttall window has a good attenuation characteristic of side lobe, and five-point polynomial transform can speed up the attenuation of side lobe spectrum, the proposed method firstly applied Nuttall window to truncate the measurement signal, then used FFT weighted polynomial transformation so as to reduce the output sequence spectrum leakage effect and improve the analysis accuracy. Through simulations and experiments, the proposed Nuttall window and five-point polynomial transform interpolated FFT algorithm is proven to be accurate and reliable. The impact factors of dielectric loss angle measurement including fundamental frequency fluctuation, number of sampling points, random noise, harmonic component, and direct current component are also analyzed in detail in this paper. © 2015, The editorial office of Transaction of China Electrotechnical Society. All right reserved.

Keyword:

Angle measurement Dielectric devices Dielectric losses Fast Fourier transforms Polynomials Spectrum analysis

Community:

  • [ 1 ] [Jin, Tao]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 2 ] [Chen, Yiyang]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 3 ] [You, Shengqiang]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China

Reprint 's Address:

  • 金涛

    [jin, tao]college of electrical engineering and automation, fuzhou university, fuzhou; 350116, china

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Source :

Transactions of China Electrotechnical Society

ISSN: 1000-6753

CN: 11-2188/TM

Year: 2015

Volume: 30

Page: 7-15

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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