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author:

Lin, Jian (Lin, Jian.) [1] | Ooi, Poh Choon (Ooi, Poh Choon.) [2] | Li, Fushan (Li, Fushan.) [3] | Guo, Tailiang (Guo, Tailiang.) [4] | Kim, Tae Whan (Kim, Tae Whan.) [5]

Indexed by:

EI

Abstract:

Non-volatile memory (NVM) devices using graphene quantum dots (GQDs) as charge trapping sites were fabricated with silver nanowires as top electrodes using solution process. The stacking structure consists of GQDs embedded between polymethylsilsesquioxane layers constructed on transparent flexible substrate. Hysteresis window was observed in the current-voltage plots, and the NVM devices are reprogrammable and stable up to × 104 s with a distinct ON/OFF ratio of 104. In addition, the memory device shows the stable hysteresis window without obvious degradation upon bending under different curvature radii. © 1980-2012 IEEE.

Keyword:

Charge trapping Electric resistance measurement Graphene Hysteresis Nanocrystals Nanowires Nonvolatile storage Semiconductor quantum dots

Community:

  • [ 1 ] [Lin, Jian]Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 2 ] [Ooi, Poh Choon]Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 3 ] [Li, Fushan]Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 4 ] [Guo, Tailiang]Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 5 ] [Kim, Tae Whan]Department of Electronics and Computer Engineering, Hanyang University, Seoul; 133-791, Korea, Republic of

Reprint 's Address:

  • [li, fushan]institute of optoelectronic display, fuzhou university, fuzhou; 350002, china

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Source :

IEEE Electron Device Letters

ISSN: 0741-3106

Year: 2015

Issue: 11

Volume: 36

Page: 1212-1214

2 . 5 2 8

JCR@2015

4 . 1 0 0

JCR@2023

ESI HC Threshold:183

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 14

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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