• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Chen, Hui (Chen, Hui.) [1] | Fu, Xin (Fu, Xin.) [2] | Liu, Qi (Liu, Qi.) [3]

Indexed by:

EI

Abstract:

The analytical solution models have been constructed to describe the slip flow in the micro/nano gaps with moving boundary, including the case of immersion lithography. The two-dimensional computational fluid dynamics models are established to validate them. The results show that the slip flow varies with time and tends to a steady state quickly. The transient and steady states are investigated respectively to overall describe the slip flow, and there are significant differences between the slip and non-slip flow. Moreover, the stationary liquid on moving wall may be generated when the direction of pressure-driven flow is opposite to the direction of shear flow. This phenomenon is important to prevent liquid leakage during wafer scanning, and the corresponding parameters are optimized to improve the quality of advanced immersion lithography. © 2014 Elsevier B.V. All rights reserved.

Keyword:

Computational fluid dynamics Lithography Shear flow Velocity distribution

Community:

  • [ 1 ] [Chen, Hui]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 2 ] [Chen, Hui]State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou; 310027, China
  • [ 3 ] [Fu, Xin]State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou; 310027, China
  • [ 4 ] [Liu, Qi]State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou; 310027, China

Reprint 's Address:

  • [chen, hui]state key laboratory of fluid power transmission and control, zhejiang university, hangzhou; 310027, china;;[chen, hui]school of mechanical engineering and automation, fuzhou university, fuzhou; 350108, china

Email:

Show more details

Related Keywords:

Related Article:

Source :

Microelectronic Engineering

ISSN: 0167-9317

Year: 2014

Volume: 123

Page: 167-170

1 . 1 9 7

JCR@2014

2 . 6 0 0

JCR@2023

ESI HC Threshold:184

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

Affiliated Colleges:

Online/Total:1393/13877467
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1