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author:

Zheng, Zhuoyong (Zheng, Zhuoyong.) [1] | Zhang, Yongai (Zhang, Yongai.) [2] | Zhang, Zhijian (Zhang, Zhijian.) [3] | Chen, Jingshui (Chen, Jingshui.) [4] | Zheng, Longwu (Zheng, Longwu.) [5] | Guo, Tailiang (Guo, Tailiang.) [6]

Indexed by:

EI PKU CSCD

Abstract:

The polyimide (PI) coatings were grown by vapor deposition polymerization (VDP) with biphenyltetracarboxylic dianhydride and 4, 4'-diaminodiphenyl ether as the reactive monomers. The influencing growth factors, including the thermal imine temperature, pressure, and etc., were evaluated. The microstructures and properties of the PI films were characterized with Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, energy dispersive spectroscopy, scanning electron microscopy, and atomic force microscopy. The results show that the PI film has good electrical properties and high thermal stability. For instance, after thermal imine processing at 300°C for 1 hour at a pressure of 1.0×10-2 Pa, the fairly compact insulating PI membrane displays a high breakdown voltage, 8.42 MV/cm, and a low leakage current, 8.2×10-5 A/cm2, at a field of 8.0 MV/cm.

Keyword:

Atomic force microscopy Electric properties Energy dispersive spectroscopy Ethers Fourier transform infrared spectroscopy Leakage currents Microstructure Nitrogen compounds Photoelectrons Polyimides Polymeric films Polymerization Scanning electron microscopy Vapors X ray photoelectron spectroscopy

Community:

  • [ 1 ] [Zheng, Zhuoyong]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Zhang, Yongai]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Zhang, Zhijian]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Chen, Jingshui]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Zheng, Longwu]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 6 ] [Guo, Tailiang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

Year: 2012

Issue: 10

Volume: 32

Page: 937-942

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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