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author:

Liao, Yufei (Liao, Yufei.) [1] | Yang, Gengjie (Yang, Gengjie.) [2] (Scholars:杨耿杰) | Gao, Wei (Gao, Wei.) [3] (Scholars:高伟) | Guo, Moufa (Guo, Moufa.) [4] (Scholars:郭谋发)

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EI Scopus

Abstract:

An internal over-voltage identification method based on atomic decomposition(AD) and Support Vector Machine(SVM) is proposed. Firstly, the three-phase voltages of bus are decomposed by AD algorithm to get the optimal atoms. According to the atom frequency, the optimal atoms are constructed as characteristic atom matrix, which can reflect the time-frequency characteristics of the over-voltage signal. Features are obtained from the characteristic atom matrix by singular value decomposition. Finally, the features are input into the SVM to achieve the identification of seven types of internal over-voltages. The proposed method is verified on the simulation platform. The results show that the proposed method has high accuracy. © 2019 Published under licence by IOP Publishing Ltd.

Keyword:

Atoms Environmental technology Singular value decomposition Support vector machines

Community:

  • [ 1 ] [Liao, Yufei]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 2 ] [Yang, Gengjie]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 3 ] [Gao, Wei]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 4 ] [Guo, Moufa]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China

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ISSN: 1755-1307

Year: 2019

Issue: 1

Volume: 223

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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