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author:

Tong, Tong (Tong, Tong.) [1] | Gao, Qinquan (Gao, Qinquan.) [2] (Scholars:高钦泉)

Indexed by:

EI Scopus

Abstract:

There has been significant interest in approaches that utilize local intensity patterns within patches to derive features for disease classification. Several existing methods explore the patch relationship between different subjects for classification. Other methods utilize the patch relationship within the same subject to aid classification. In this paper, we proposed a new approach to extract different types of features by utilizing the patch relationships within and between subjects. Specifically, features are first extracted by exploiting the patch relationship between subjects. Then, the relationship among patches within the same subject is modeled as a network and features are derived from the constructed network. Finally, these two different types of features are integrated into one framework for identifying mild cognitive impairment (MCI) subjects who will progress to Alzheimer’s disease. Using the standardized ADNI database, the proposed method can achieve an area under the receiver operating characteristic curve (AUC) of 81.3 % in discriminating patients with stable MCI and progressive MCI in a 10-fold cross validation, demonstrating that the integration of patch relationship between and within subjects can aid the prediction of MCI to AD conversion. © Springer International Publishing Switzerland 2015.

Keyword:

Computation theory Intelligent computing Magnetic resonance imaging

Community:

  • [ 1 ] [Tong, Tong]Department of Computing, Imperial College London, London, United Kingdom
  • [ 2 ] [Gao, Qinquan]Province Key Lab of Medical Instrument and Pharmaceutical Technology, Fuzhou University, Fuzhou, China

Reprint 's Address:

  • 高钦泉

    [gao, qinquan]province key lab of medical instrument and pharmaceutical technology, fuzhou university, fuzhou, china

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Source :

ISSN: 0302-9743

Year: 2015

Volume: 9226

Page: 500-509

Language: English

0 . 4 0 2

JCR@2005

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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