Traditional　flicker　detection　of　IEC　needs　design　multiple　filters,　the　process　is　complex　and　the　computational　burden　is　heavy.　A　method　for　computing　the　short　term　flicker　severity　based　on　EMD　(empirical　mode　decomposition)　and　TEO　(Teager　energy　operator)　is　proposed　in　this　paper.　It　extracts　voltage　flicker　envelop　which　captures　the　main　flicker　characteristic　from　the　voltage　signal　of　PCC(Point　of　Common　Coupling)　by　using　the　dynamic　phasor　method.　Then　it　divides　flicker　envelop　of　the　non-stationary　signal　into　several　stationary　components　and　negligible　remaining　with　EMD,　identifies　the　frequency　and　amplitude　of　each　component　with　TEO　and　then　computes　the　flicker　severity　of　power　consumer.　The　validity　of　the　method　is　verified　by　simulation　finally.　©　2014　IEEE.