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author:

Guan, T. (Guan, T..) [1] | Yang, F. (Yang, F..) [2] | Wang, W. (Wang, W..) [3] | Liu, P. (Liu, P..) [4] | Fan, Z. (Fan, Z..) [5] | Cheng, L. (Cheng, L..) [6] | Chen, Z. (Chen, Z..) [7] | Yu, R. (Yu, R..) [8] | Zhao, Q. (Zhao, Q..) [9] | Zhang, D. (Zhang, D..) [11]

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Scopus

Abstract:

This paper reported a novel high-roundness deep-depth great-selectivity HNA, i.e. hydrofluoric acid + nitric acid + acetic acid, etching system for silicon deep-hole corrosion for the first time. A fluid model based on finite element method (FEM) is established to research HNA deep-hole corrosion mechanism based on the analysis of etchant flowing patterns and the transport mode of reactant and resultant. HNA deep smooth circular-hole corrosion is achieved, which can be widely used for pressure sensor, gyroscope and flowmeter, etc. The system can reinforce complex high-level microelectromechanical systems (MEMS) design with an effective fabrication technic. HNA ratio is designed as 2:7:1, the Si 3 N 4 mask selection is more than 2200, corrosion rate is close to 11 μ m. Corrosion depth reaches 337.5μm. The inhomogeneity of corrosion depth between different holes is less than 3.6%. The maximum height fluctuation in the hole is less than 0.88% of the corrosion depth. The roundness of the hole is less than 5%0. © 2018 IEEE.

Keyword:

etchant flowing patterns; HNA etching system; silicon deep-hole corrosion

Community:

  • [ 1 ] [Guan, T.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 2 ] [Yang, F.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 3 ] [Wang, W.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 4 ] [Liu, P.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 5 ] [Fan, Z.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 6 ] [Cheng, L.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 7 ] [Chen, Z.]Fuzhou University, Institute of Physics and Information Engineering, Fuzhou, China
  • [ 8 ] [Yu, R.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 9 ] [Zhao, Q.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 10 ] [Wang, W.]Peking University, Institute of Microelectronics, Beijing, China
  • [ 11 ] [Zhang, D.]Peking University, Institute of Microelectronics, Beijing, China

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Source :

Micro Engineered and Molecular Systems

Year: 2018

Page: 397-400

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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