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author:

黄继伟 (黄继伟.) [1] (Scholars:黄继伟) | 康健 (康健.) [2]

Indexed by:

CQVIP PKU CSCD

Abstract:

为了减少分段式电容阵列ADC中分段电容引起的电容失配效应对转换精度的影响,采用最小均方根(LMS)迭代方法,实现了一种基于扰动的逐次逼近型(SAR) ADC数字前台校准算法.对同一个模拟输入信号先后加入作为扰动的模拟失调电压+△d和-△d,依次进行量化.使用LMS对两次量化结果进行加权迭代,得到最佳权重,实现了对ADC的校准.针对电容失配效应、寄生电容效应的影响,搭建了14位SAR ADC数模混合仿真验证系统.仿真结果表明,该校准算法将系统的无杂散动态范围(SFDR)从62.6 dB提升到87.7 dB.

Keyword:

数字校准 最小均方根 逐次逼近型模数转换

Community:

  • [ 1 ] [黄继伟]福州大学
  • [ 2 ] [康健]福州大学

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Source :

微电子学

ISSN: 1004-3365

CN: 50-1090/TN

Year: 2019

Issue: 5

Volume: 49

Page: 708-712

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 0

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