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author:

Liu, Y. (Liu, Y..) [1] | Zheng, Y. (Zheng, Y..) [2] | Zhu, Y. (Zhu, Y..) [3] | Ma, F. (Ma, F..) [4] | Zheng, X. (Zheng, X..) [5] | Yang, K. (Yang, K..) [6] | Xu, Z. (Xu, Z..) [8] | Ju, S. (Ju, S..) [9] | Guo, T. (Guo, T..) [11] | Qian, L. (Qian, L..) [12] | Li, F. (Li, F..) [13]

Indexed by:

Scopus

Abstract:

Anticounterfeiting techniques based on physical unclonable functions exhibit great potential in security protection of extensive commodities from daily necessities to high-end products. Herein, we propose a facile strategy to fabricate an unclonable super micro fingerprint (SMFP) array by introducing in situ grown perovskite crystals for multilevel anticounterfeiting labels. The unclonable features are formed on the basis of the differential transportation of a microscale perovskite precursor droplet during the inkjet printing process, coupled with random crystallization and Ostwald ripening of perovskite crystals originating from their ion crystal property. Furthermore, the unclonable patterns can be readily tailored by tuning in situ crystallization conditions of the perovskite. Three-dimensional height information on the perovskite patterns are introduced into a security label and further transformed into structural color, significantly enhancing the capacity of anticounterfeiting labels. The SMFPs are characterized with tunable multilevel anticounterfeiting properties, including macroscale patterns, microscale unclonable pattern, fluorescent two-dimensional pattens, and colorful three-dimensional information. © 2020 American Chemical Society.

Keyword:

anticounterfeiting; fingerprint pattern; inkjet printing; Ostwald ripening; perovskite

Community:

  • [ 1 ] [Liu, Y.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 2 ] [Zheng, Y.]College of Chemistry, Fuzhou University, Fuzhou, 350108, China
  • [ 3 ] [Zhu, Y.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 4 ] [Ma, F.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 5 ] [Zheng, X.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 6 ] [Yang, K.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 7 ] [Zheng, X.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 8 ] [Xu, Z.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 9 ] [Ju, S.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 10 ] [Zheng, Y.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 11 ] [Guo, T.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 12 ] [Qian, L.]TCL Corporate Research, Shenzhen, 518067, China
  • [ 13 ] [Li, F.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China

Reprint 's Address:

  • [Li, F.]Institute of Optoelectronic Technology, Fuzhou UniversityChina

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Source :

ACS Applied Materials and Interfaces

ISSN: 1944-8244

Year: 2020

Issue: 35

Volume: 12

Page: 39649-39656

9 . 2 2 9

JCR@2020

8 . 5 0 0

JCR@2023

ESI HC Threshold:196

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 61

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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