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author:

Yongli, Y. (Yongli, Y..) [1] | Shuying, C. (Shuying, C..) [2] | Songlin, L. (Songlin, L..) [3]

Indexed by:

Scopus

Abstract:

Silver-doping in SnS films can improve the semiconducting properties of SnS films. Based on our previous research, SnS:Ag thin films were deposited on ITO coated glass by pulse electro-deposition in order to study their structural, optical and electrical properties. SnS:Ag thin films were characterized with X-ray diffraction (XRD), Scanning Electron Microscope (SEM) and some other methods. The primary composition of the films is SnS, but maybe there is a little quantity of SnS2, Ag8SnS6 and other compounds. The doped films exhibit good crystallization with big grain size. They have an optical gap of 1.66∼1.89eV and a high absorption coefficient (α> 5×104cm01). Hall measurement has shown that all the samples are of p-type conduction with low resistivity of the order of 10-3Ω·cm, and the carrier concentration increases to 1019cm-3 after Ag-doping. In conclusion, the semiconducting properties of the SnS films have been improved by silver-doping. Thus, SnS:Ag thin films can be used as solar cells absorbers. © 2009 Trans Tech Publications, Switzerland.

Keyword:

Ag doping; Optical and electrical properties; Pulse electrodeposition; SnS:Ag thin films

Community:

  • [ 1 ] [Yongli, Y.]Ministry of Education Key Laboratory of Analysis and Detection Technology for Food Safety, Department of Chemistry, Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 2 ] [Shuying, C.]Ministry of Education Key Laboratory of Analysis and Detection Technology for Food Safety, Department of Chemistry, Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 3 ] [Shuying, C.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 4 ] [Songlin, L.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China

Reprint 's Address:

  • [Shuying, C.]Ministry of Education Key Laboratory of Analysis and Detection Technology for Food Safety, Department of Chemistry, Fuzhou University, Fuzhou, Fujian, 350108, China

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Source :

Advanced Materials Research

ISSN: 1022-6680

Year: 2009

Volume: 60-61

Page: 105-109

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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