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author:

Guo, T.-L. (Guo, T.-L..) [1] | Ma, L.-A. (Ma, L.-A..) [2] | Lin, Z.-X. (Lin, Z.-X..) [3] | Ye, Y. (Ye, Y..) [4]

Indexed by:

Scopus

Abstract:

in this paper we report the fabrication and testing of backgated triode structure field emission (FED) devices with SnO2-nanowires-based cathodes. Field-emission measurement reveals that the SnO2-nanowires FED devices posses a good emission property with low turn-on voltage (~150 V), high emission current (~ 390 uμA) and long-term emission stability. © 2009 IEEE.

Keyword:

Crystal growth; Field emission; Tin oxide

Community:

  • [ 1 ] [Guo, T.-L.]Institutes of Optoelectronics and Displays Technology, Fuzhou University, Fuzhou, 350002, China
  • [ 2 ] [Ma, L.-A.]Institutes of Optoelectronics and Displays Technology, Fuzhou University, Fuzhou, 350002, China
  • [ 3 ] [Ma, L.-A.]Department of materials science and Engineering, Fujian University of Technology, Fuzhou, 350014, China
  • [ 4 ] [Lin, Z.-X.]Institutes of Optoelectronics and Displays Technology, Fuzhou University, Fuzhou, 350002, China
  • [ 5 ] [Ye, Y.]Institutes of Optoelectronics and Displays Technology, Fuzhou University, Fuzhou, 350002, China

Reprint 's Address:

  • [Guo, T.-L.]Institutes of Optoelectronics and Displays Technology, Fuzhou University, Fuzhou, 350002, China

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Source :

2009 IEEE Nanotechnology Materials and Devices Conference, NMDC 2009

Year: 2009

Page: 84-86

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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