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author:

Jia, H.-J. (Jia, H.-J..) [1] | Cheng, S.-Y. (Cheng, S.-Y..) [2]

Indexed by:

Scopus

Abstract:

SnS thin films were deposited on glass substrates by using the thermal evaporation technique at different substrate temperatures. By varying the substrate temperature in the range of 50°C-200°C, the influence of the substrate temperature on the microstructure, morphology and photo-electrical properties of the films was investigated. The research result shows following: With the increase of substrate temperature from 50°C, to 200°C, the crystallinity and smoothness of SnS films become better, and the grains in the films become bigger, and the average roughness is reduced from 19.1 nm to 3.92 nm, and the average diameter is increased from 100 nm to 150 nm. With the increase of substrate temperature from 50°C to 200°C, the carrier concentration of the films is increased from 7.118 × 1013 cm-3 to 2.169 × 1015 cm-3, while the resistivity is decreased from 641.8 Ω·cm to 206.2 Ω·cm. However, the substrate temperature has no effect on the phase and conductivity of the films. The SnS films prepared at different substrate temperature are polycrystalline SnS with orthogonal structure, and the crystallites in the films are exclusively oriented along the (111) direction. And the films are of p-type conduction.

Keyword:

Property; SnS thin films; Substrate temperature; Vacuum thermal evaporation

Community:

  • [ 1 ] [Jia, H.-J.]State Key Laboratory Breeding Base of Photocatalysis, College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Cheng, S.-Y.]State Key Laboratory Breeding Base of Photocatalysis, College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

Reprint 's Address:

  • [Jia, H.-J.]State Key Laboratory Breeding Base of Photocatalysis, College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

Email:

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Source :

Microfabrication Technology

ISSN: 1003-8213

Year: 2008

Issue: 4

Page: 32-34

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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