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author:

Fu, Q. (Fu, Q..) [1] | Xu, Q. (Xu, Q..) [2] | Zhao, Z. (Zhao, Z..) [3] | Liu, X. (Liu, X..) [4] | Huang, Y. (Huang, Y..) [5] | Hu, X. (Hu, X..) [6] | Zhuang, N. (Zhuang, N..) [7] | Chen, J. (Chen, J..) [8]

Indexed by:

Scopus

Abstract:

Ce3+-doped Gd3Fe5O12 (Ce:GIG) film has a good application prospect in the field of integrated optical device. In this article, Ce:GIG and Ce,Ga:GIG films were deposited onto the quartz glass substrate by using radio-frequency magnetron sputtering technology. The crystal phase, surface morphology, magnetization, and magnetic circular dichroism properties of films were characterized by using the X-ray powder diffraction, atomic force microscopy, vibrating sample magnetometer, and circular dichroism spectrometer. The results show that as-prepared Ce,Ga:GIG films has a good quality and show an excellent magneto-optical performance, and the doping of Ga3+ ion and the annealing process have significant effect on the magnetism and magneto-optical performances. It is expected that Ce,Ga:GIG film with a moderate Ga3+-doping content is a better candidate than Ce:GIG and Ce:YIG films for the next generation of integrated optical isolator and other magneto-optical equipment. © 2015 The American Ceramic Society.

Keyword:

Community:

  • [ 1 ] [Fu, Q.]College of Chemistry, Fuzhou University, Fuzhou, 350116, China
  • [ 2 ] [Xu, Q.]College of Chemistry, Fuzhou University, Fuzhou, 350116, China
  • [ 3 ] [Zhao, Z.]College of Chemistry, Fuzhou University, Fuzhou, 350116, China
  • [ 4 ] [Liu, X.]College of Chemistry, Fuzhou University, Fuzhou, 350116, China
  • [ 5 ] [Huang, Y.]College of Chemistry, Fuzhou University, Fuzhou, 350116, China
  • [ 6 ] [Hu, X.]College of Chemistry, Fuzhou University, Fuzhou, 350116, China
  • [ 7 ] [Zhuang, N.]College of Chemistry, Fuzhou University, Fuzhou, 350116, China
  • [ 8 ] [Chen, J.]College of Chemistry, Fuzhou University, Fuzhou, 350116, China

Reprint 's Address:

  • [Zhuang, N.]College of Chemistry, Fuzhou UniversityChina

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Source :

Journal of the American Ceramic Society

ISSN: 0002-7820

Year: 2016

Issue: 1

Volume: 99

Page: 234-240

2 . 8 4 1

JCR@2016

3 . 5 0 0

JCR@2023

ESI HC Threshold:324

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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