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author:

Zhang, Q. (Zhang, Q..) [1] | Fang, L. (Fang, L..) [2] | Shen, J. (Shen, J..) [3] | Pascual, M.J. (Pascual, M.J..) [4] | Zhang, T. (Zhang, T..) [5]

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Scopus

Abstract:

The interfacial reaction between sealing glasses and Cr-containing interconnect presents a challenge for the development of solid oxide fuel cell (SOFC). In this work, we report that the interfacial reaction between bismuth-containing sealing glasses and Cr-containing interconnect can be tailored by ZnO dopant. The addition of ZnO contributes to a more open glass structure, resulting in the facilitated diffusion of ions in glass and thus the increase in the interfacial reaction. On the other hand, the further increase in ZnO content enhances the Bi3+→Bi5+ transition in glasses and reduces the redox interfacial reaction by consuming the oxygen available at the glass/metal interface. In addition, good joining can be observed at the sealing interface between ZnO-containing glass-ceramics and Crofer 22 APU, held in air at 700°C for 1400 h. Moreover, the glass-ceramics show considerable electrical stability in oxidizing and reducing atmospheres. The reported results support the suitability of prepared glass-ceramics as sealing materials for SOFC applications. © 2015 The American Ceramic Society.

Keyword:

Community:

  • [ 1 ] [Zhang, Q.]College of Materials Science and Engineering Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 2 ] [Fang, L.]College of Materials Science and Engineering Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 3 ] [Shen, J.]College of Materials Science and Engineering Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 4 ] [Pascual, M.J.]Instituto de Cerámica y Vidrio (CSIC), Kelsen 5, Campus de Cantoblanco, Madrid, 28049, Spain
  • [ 5 ] [Zhang, T.]College of Materials Science and Engineering Fuzhou University, Fuzhou, Fujian, 350108, China

Reprint 's Address:

  • [Zhang, T.]College of Materials Science and Engineering Fuzhou UniversityChina

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Source :

Journal of the American Ceramic Society

ISSN: 0002-7820

Year: 2015

Issue: 12

Volume: 98

Page: 3797-3806

2 . 7 8 7

JCR@2015

3 . 5 0 0

JCR@2023

ESI HC Threshold:335

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 13

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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