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author:

Li, S. (Li, S..) [1] | Lam, K.-T. (Lam, K.-T..) [2] | Huang, W.-C. (Huang, W.-C..) [3] | Chang, S.-J. (Chang, S.-J..) [4]

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Scopus

Abstract:

The authors propose the use of SU-8 to passivate the isolation trenches of GaN-based high-voltage light-emitting diodes (HV-LEDs). Compared with the HV-LED chips prepared with pure SU-8 passivation, it was found that we could increase the production yield from ≤ 35% to ≥ 88% using properly diluted SU-8 passivation layer. It was also found that we could reduce the passivation layer thickness by diluting SU-8 with a ratio of 5:2. Furthermore, it was found that the properly diluted SU-8 could provide smooth surface, minimized crack formation, and thus larger production yield. © 2005-2012 IEEE.

Keyword:

Crack; GaN; HV-LEDs; production yield; SU-8

Community:

  • [ 1 ] [Li, S.]College of Science, China University of Petroleum (East China), Qingdao, Shandong 266580, China
  • [ 2 ] [Lam, K.-T.]Institute of Creative Industries Research, Fuzhou University, Fuzhou, Fujian Province 361024, China
  • [ 3 ] [Huang, W.-C.]Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan, 70101, Taiwan
  • [ 4 ] [Chang, S.-J.]Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan, 70101, Taiwan

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Source :

Journal of Display Technology

ISSN: 1551-319X

Year: 2015

Issue: 4

Volume: 11

Page: 374-377

1 . 9 2 5

JCR@2015

1 . 5 3 0

JCR@2016

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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