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author:

Wang, T. (Wang, T..) [1] | Yang, Y. (Yang, Y..) [2] | Ren, Y. (Ren, Y..) [3] | Zhu, D. (Zhu, D..) [4] | Zhang, T. (Zhang, T..) [5]

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Abstract:

In recent years, the reactive wetting of Ni-Si on graphite has attracted increasing attention. However, most attention has been focused on the effect of Si on the wetting behavior of Ni-Si/C systems. In this work, the wetting process of Ni-Si alloys with different Si content (20, 28, 35, 45 and 55 wt%) on graphite substrates has been investigated at 1523 K in a high vacuum using a modified sessile drop method. The threshold activity of Si in liquid to form SiC at 1523 K can be calculated to be 0.0173, corresponding to a Si content of 33 at% (19 wt%). In addition, a minimum equilibrium contact angle of 20° can be observed in the Ni-45 wt% Si/C system. The adsorption energies of Si at the interface and at the surface of the Ni metal are 5.36 kJ mol-1 and -20.9 kJ mol-1, respectively; whereas, the adsorption energies of Ni at the interface and at the surface of the Si metal are -5.38 kJ mol-1 and 68.9 kJ mol-1, respectively. Moreover, the effects of Si and Ni on the change in the equilibrium contact angle have been evaluated in terms of the solid-liquid interfacial energy and the surface energy of the liquid alloy. © The Royal Society of Chemistry 2015.

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Community:

  • [ 1 ] [Wang, T.]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 2 ] [Yang, Y.]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 3 ] [Ren, Y.]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 4 ] [Zhu, D.]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 5 ] [Zhang, T.]College of Materials Science and Engineering, Fuzhou University, Fuzhou, Fujian, 350108, China

Reprint 's Address:

  • [Zhu, D.]College of Materials Science and Engineering, Fuzhou UniversityChina

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Source :

RSC Advances

ISSN: 2046-2069

Year: 2015

Issue: 110

Volume: 5

Page: 90866-90870

3 . 2 8 9

JCR@2015

3 . 9 0 0

JCR@2023

ESI HC Threshold:265

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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