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author:

Luan, Q. (Luan, Q..) [1] | Lam, K.-T. (Lam, K.-T..) [2] | Chang, S.-J. (Chang, S.-J..) [3]

Indexed by:

Scopus

Abstract:

The study of thermal properties for GaN-based light-emitting diodes (LEDs) with various last barrier thicknesses was reported. It was found that the LED output power decreased as we increased the thickness of the last barrier. It was also found that the LED output powers decrease with the increase of temperature for the LEDs with 12-, 24-, and 48-nm-thick last barriers. However, it was found that the LED output power increases with the increase of temperature for the LED with a 72-nm-thick last barrier due to the fact that more holes could enter the multiquantum well active region at elevated temperatures. Furthermore, it was found that the output power decreased by 0.15%/°C, 0.15%/°C, and 0.11%/°C for the LEDs with 12-, 24-, and 48-nm-thick last barriers, respectively, but increased by 0.09%/°C for the LED with a 72-nm-thick last barrier. © 2015 Society of Photo-Optical Instrumentation Engineers.

Keyword:

efficiency droop; GaN; hot/cold factor; last barrier thickness; light-emitting diodes

Community:

  • [ 1 ] [Luan, Q.]Shandong College of Electronic Technology, Department of Electronic Engineering, Jinan, Shandong 250014, China
  • [ 2 ] [Lam, K.-T.]Fuzhou University, Institute of Creative Industries Research, Jimei, Xiamen, Fujian 361024, China
  • [ 3 ] [Chang, S.-J.]National Cheng Kung University, Advanced Optoelectronic Technology Center, Department of Electrical Engineering, Tainan, 70101, Taiwan

Reprint 's Address:

  • [Chang, S.-J.]National Cheng Kung University, Advanced Optoelectronic Technology Center, Department of Electrical EngineeringTaiwan

Email:

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Source :

Journal of Photonics for Energy

ISSN: 1947-7988

Year: 2015

Issue: 1

Volume: 5

1 . 5 2 7

JCR@2015

1 . 5 0 0

JCR@2023

ESI HC Threshold:200

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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