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author:

He, C. (He, C..) [1] | Chen, Z. (Chen, Z..) [2] | Lin, D. (Lin, D..) [3] | Chen, Y. (Chen, Y..) [4] | Shao, Y. (Shao, Y..) [5] | Yi, Z. (Yi, Z..) [6] | Tang, D. (Tang, D..) [7]

Indexed by:

Scopus PKU CSCD

Abstract:

Ti/IrO2-Ta2O5 electrodes were prepared by a low thermal decomposition method. The influence of Ta contents on the microstructure and capacitive performance of the Ti/IrO2-Ta2O5 electrodes was investigated by XRD, cyclic voltammetry, electrochemical impedance spectroscopy and galvanostatic charge-discharge tests. The results show that Ta2O5 can inhibit crystallization of the IrO2. With increasing Ta content, the crystallization degree decreases. When the content of Ta is 60 mol%, the electrode with a content of 6.4% crystalline structure has a superior capacitive performance of 239.2 g/F, which is considerably higher than that of IrO2 electrode (54.1 g/F). © 2017, Science Press. All right reserved.

Keyword:

AC impedance spectroscopy; IrO2; Supercapacitors; Ta2O5

Community:

  • [ 1 ] [He, C.]School of Materials Science & Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 2 ] [Chen, Z.]School of Materials Science & Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 3 ] [Lin, D.]Electric Power Research Institute of State Grid Fujian Electric Power Co. Ltd, Fuzhou, 350007, China
  • [ 4 ] [Chen, Y.]Electric Power Research Institute of State Grid Fujian Electric Power Co. Ltd, Fuzhou, 350007, China
  • [ 5 ] [Shao, Y.]School of Materials Science & Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 6 ] [Yi, Z.]School of Materials Science & Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 7 ] [Tang, D.]School of Materials Science & Engineering, Fuzhou University, Fuzhou, 350108, China

Reprint 's Address:

  • [Shao, Y.]School of Materials Science & Engineering, Fuzhou UniversityChina

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Source :

Rare Metal Materials and Engineering

ISSN: 1002-185X

Year: 2017

Issue: 9

Volume: 46

Page: 2589-2593

0 . 2 9

JCR@2017

0 . 6 0 0

JCR@2023

ESI HC Threshold:306

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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