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author:

Han, G. (Han, G..) [1] | Chen, S. (Chen, S..) [2] | Zhang, D. (Zhang, D..) [3]

Indexed by:

Scopus

Abstract:

AFM images are distorted representations of sample surfaces due to the dilation produced by the AFM tip shape in micro/nano-scale profile measurement. It is necessary to obtain the tip shape information in order to correct such distortion in micro/nano metrology. Ordered nano porous alumina templates have attracted increasing attention in recent years due to their possible utilization as templates for the organization of nanosize structures or others. Porous anodic alumina membrane is used as an AFM tip characterizer to estimate the AFM tip shape and scanning direction-based characterization method is used to estimate the AFM tip shape. © 2011 IEEE.

Keyword:

AFM Tip; Atomic Force Microscopy; Blind Tip Estimation; Porous Anodic Alumina Membrane

Community:

  • [ 1 ] [Han, G.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 2 ] [Han, G.]School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, 710049, China
  • [ 3 ] [Chen, S.]School of Mathematics and Computer Science, Fuzhou University, Fuzhou, Fujian, 350108, China
  • [ 4 ] [Zhang, D.]School of Mathematics and Computer Science, Fuzhou University, Fuzhou, Fujian, 350108, China

Reprint 's Address:

  • [Han, G.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, Fujian, 350108, China

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Source :

Micro Engineered and Molecular Systems

Year: 2011

Page: 1060-1063

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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