Raman spectroscopy of In2S3: Ag thin films - Details

author：

Lin, S.-L. (Lin, S.-L..) ^[1] | Ma, J. (Ma, J..) ^[2] | Cheng, S.-Y. (Cheng, S.-Y..) ^[3]

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Scopus PKU CSCD

Abstract：

The　characteristics　of　undoped　and　silver　doped　In2S3　films　were　studied　via　Raman　spectroscopy,　X-ray　diffraction　and　scanning　electron　microscope.　The　phase　of　In2S3　films　was　identified　by　XRD　which　showed　the　change　of　grain　size　after　silver　doped.　As　the　films　doped　with　silver,　the　red　shift　of　Raman　bands　(232,　272　and　300　cm-1)　of　In2S3　films　took　place.　The　broadening　of　linewidths　(FWHM)　of　some　Raman　bands　indicated　the　exist　of　interstitial　silver　ions.　The　SEM　pictures　showed　the　growth　pattern　and　the　larger　grain　size　of　In2S3:　Ag　films.

Keyword：

Dopant; In2S3 thin film; Raman spectroscopy

Community：

[ 1 ] [Lin, S.-L.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350018, China
[ 2 ] [Ma, J.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350018, China
[ 3 ] [Cheng, S.-Y.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350018, China

Reprint 's Address：

[Ma, J.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350018, China

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Source ：

Journal of Functional Materials

ISSN： 1001-9731

Year： 2013

Issue： 18

Volume： 44

Page： 2724-2726

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SCOPUS Cited Count： 1

ESI Highly Cited Papers on the List： 0 Unfold All

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30 Days PV： 0

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