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author:

Zhang, Y. (Zhang, Y..) [1] | Lin, T. (Lin, T..) [2] | Zeng, X. (Zeng, X..) [3] | Zhang, J. (Zhang, J..) [4] | Zhou, X. (Zhou, X..) [5] | Guo, T. (Guo, T..) [6]

Indexed by:

Scopus PKU CSCD

Abstract:

The surface-conduction electron-emission source, based on planar-gate triode with SnO2 film emitters, has been successfully fabricaed on glass substrate by magnetron sputtering, photolithography, and lift-off technology. The microstructures and field emission characteristics were characterized with scanning electron microscopy (SEM) and optical microscopy. Theresults show that the islands of tin oxide, about 100~300 nm in diameter, were depostied at the gap between the cathode and gate electrode, and that the gate voltage was capable of effectively controlling the emission and conduction currents. The electron-emission efficiency was found to be around 0.85% and the maximun brightness could reach 850 cd/m2, indicating that the SnO2 film may be a good material for fabrication of surface-conduction electron-conduction electron-emission source based on planar-gate triode.

Keyword:

Electron emission source; Planar-gate; SnO2 film; Surface-conduction

Community:

  • [ 1 ] [Zhang, Y.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Lin, T.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Zeng, X.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Zhang, J.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Zhou, X.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 6 ] [Guo, T.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

Reprint 's Address:

  • [Guo, T.]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

Year: 2013

Issue: 12

Volume: 33

Page: 1214-1218

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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