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author:

Lin, W.-J. (Lin, W.-J..) [1] | Yang, X.-X. (Yang, X.-X..) [2] | Lin, N.-C. (Lin, N.-C..) [3] | Zhu, Z.-B. (Zhu, Z.-B..) [4]

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Abstract:

In order to be able to suppress direct wave of TOFD (time of flight diffraction) D scanning image, a new method was introduced. In order to remove noise, firstly the TOFD D scanning image was decomposed into a series of one-dimensional signals. Then wavelet denoising was used to remove noise of one-dimensional signal. Finally, with a series of processed signals a new image was reconstructed. The effect of parameters on the filtering results would be discussed for the comparison of RLS (recursive least square) adaptive filtering algorithm and variable step-size LMS (least mean square) adaptive filtering algorithm, and variable step-size LMS adaptive filtering algorithm would be used. Moreover, an improved algorithm was introduced to suppress direct wave of a non-near surface defect image. The result demonstrated that the algorithm was available.

Keyword:

Adaptive filtering; Algorithm; Direct wave suppression; Time of flight diffraction

Community:

  • [ 1 ] [Lin, W.-J.]Fuzhou University, College of Mechanical Engineering and Automation, Fuzhou 350108, China
  • [ 2 ] [Yang, X.-X.]Fuzhou University, College of Mechanical Engineering and Automation, Fuzhou 350108, China
  • [ 3 ] [Yang, X.-X.]College of Chemistry and Chemical Engineering, College of Mechanical Engineering and Automation, Fuzhou 350108, China
  • [ 4 ] [Lin, N.-C.]College of Chemistry and Chemical Engineering, College of Mechanical Engineering and Automation, Fuzhou 350108, China
  • [ 5 ] [Lin, N.-C.]Xiamen Inspection Institute of Special Equipments, Xiamen 361000, China
  • [ 6 ] [Zhu, Z.-B.]Fuzhou University, College of Mechanical Engineering and Automation, Fuzhou 350108, China
  • [ 7 ] [Zhu, Z.-B.]Xiamen Inspection Institute of Special Equipments, Xiamen 361000, China

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Source :

Petrochemical Equipment

ISSN: 1000-7466

CN: 62-1078/TQ

Year: 2013

Issue: 6

Volume: 42

Page: 11-16

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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