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author:

Ji, L.W. (Ji, L.W..) [1] | Water, W. (Water, W..) [2] | Hsiao, Y.J. (Hsiao, Y.J..) [3] | Tsai, J.K. (Tsai, J.K..) [4] | Lam, K.T. (Lam, K.T..) [5] | Meen, T.H. (Meen, T.H..) [6] | Chen, Y.F. (Chen, Y.F..) [7] | Shih, W.S. (Shih, W.S..) [8]

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Scopus

Abstract:

This study demonstrates that anatase TiO 2 thin films were grown on Corning glass substrates by radio frequency magnetron sputtering and were then used to fabricate metal-semiconductor-metal (MSM) ultraviolet (UV) photodetectors (PDs) with different contact electrodes (Ag or Au). With a 320-nm illumination and 5 V applied bias, the responsivities for the Ag/TiO 2 /Ag and Au/TiO 2 /Au MSM PDs were 4.31 and 16.6 A/W, respectively. Additionally, the photoconductive gain and Schottky barrier height at the Ag/TiO 2 and Au/TiO 2 interfaces were also discussed in the investigation. Copyright © Taylor & Francis Group, LLC.

Keyword:

Photodetectors; Titanium dioxides; Ultraviolet

Community:

  • [ 1 ] [Ji, L.W.]Institute of Electro-Optical and Materials Science, National Formosa University, Yunlin 632, Taiwan
  • [ 2 ] [Water, W.]Department of Electronic Engineering, National Formosa University, Yunlin 632, Taiwan
  • [ 3 ] [Hsiao, Y.J.]National Nano Device Laboratories, Tainan 741, Taiwan
  • [ 4 ] [Tsai, J.K.]Department of Electronic Engineering, National Formosa University, Yunlin 632, Taiwan
  • [ 5 ] [Lam, K.T.]Institute of Creative Industries Research, Fuzhou University, China
  • [ 6 ] [Meen, T.H.]Department of Electronic Engineering, National Formosa University, Yunlin 632, Taiwan
  • [ 7 ] [Chen, Y.F.]Department of Mechanical Engineering, National Kaohsiung University of Applied Sciences, Kaohsiung 807, Taiwan
  • [ 8 ] [Shih, W.S.]Institute of Electro-Optical and Materials Science, National Formosa University, Yunlin 632, Taiwan

Reprint 's Address:

  • [Ji, L.W.]Institute of Electro-Optical and Materials Science, National Formosa University, Yunlin 632, Taiwan

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Source :

Integrated Ferroelectrics

ISSN: 1058-4587

Year: 2013

Issue: 1

Volume: 143

Page: 65-70

Language: English

0 . 3 7 1

JCR@2013

0 . 7 0 0

JCR@2023

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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