Temperature dependence of anisotropic mode splitting induced by birefringence in an InGaAs/GaAs/AlGaAs vertical-cavity surface-emitting laser studied by reflectance difference spectroscopy - Details

author：

Yu, J. (Yu, J..) ^[1] | Chen, Y. (Chen, Y..) ^[2] | Cheng, S. (Cheng, S..) ^[3] | Lai, Y. (Lai, Y..) ^[4]

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Abstract：

The　temperature　dependence　of　the　mode　splitting　induced　by　birefringence　in　an　InGaAs/GaAs/AlGaAs　vertical-cavity　surface-emitting　laser　has　been　studied　by　reflectance　difference　spectroscopy　at　different　temperatures　ranging　from　80　to　330　K.　The　anisotropic　broadening　width　and　the　anisotropic　integrated　area　of　the　cavity　mode　under　different　temperatures　are　also　determined.　The　relation　between　the　mode　splitting　and　the　birefringence　is　obtained　by　theoretical　calculation　using　a　Jones　matrix　approach.　The　temperature　dependence　of　the　energy　position　of　the　cavity　mode　and　the　quantum　well　transition　are　also　determined　by　nearly　normal　reflectance　and　photoluminescence,　respectively.　©　2013　Optical　Society　of　America.

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Community：

[ 1 ] [Yu, J.]College of Physics and Information Engineering, Institute of Micro/Nano Devices and Solar Cells, Fuzhou University, Fuzhou, Fujian Province 350108, China
[ 2 ] [Chen, Y.]Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, China
[ 3 ] [Cheng, S.]College of Physics and Information Engineering, Institute of Micro/Nano Devices and Solar Cells, Fuzhou University, Fuzhou, Fujian Province 350108, China
[ 4 ] [Lai, Y.]College of Physics and Information Engineering, Institute of Micro/Nano Devices and Solar Cells, Fuzhou University, Fuzhou, Fujian Province 350108, China

Reprint 's Address：

[Yu, J.]College of Physics and Information Engineering, Institute of Micro/Nano Devices and Solar Cells, Fuzhou University, Fuzhou, Fujian Province 350108, China

Email：

jlyu@semi.ac.cn

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Source ：

Applied Optics

ISSN： 1559-128X

Year： 2013

Issue： 5

Volume： 52

Page： 1035-1040

1 . 6 4 9

JCR@2013

1 . 7 0 0

JCR@2023

JCR Journal Grade：2

CAS Journal Grade：3

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ESI Highly Cited Papers on the List： 0 Unfold All

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Chinese Cited Count：

30 Days PV： 1

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