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author:

Chen, G.-H. (Chen, G.-H..) [1] | Yu, Y. (Yu, Y..) [2] | Luo, Z.-Z. (Luo, Z.-Z..) [3] | Wu, Q.-X. (Wu, Q.-X..) [4]

Indexed by:

Scopus PKU CSCD

Abstract:

The performance of AZ5214E image-reversal photoresist was studied and achieves negative sidewalls when choosing proper processes. They are good for lift-off technics. It could be used to lift off 2 μm Au for the facture of RF MEMS switch. The negative sidewalls can be observed with SEM.

Keyword:

AZ5214E; Image-reversal; Lift-off

Community:

  • [ 1 ] [Chen, G.-H.]Dept. of Electron. Sci. and Technol., Fuzhou Univ., Fuzhou 350002, China
  • [ 2 ] [Yu, Y.]Dept. of Electron. Sci. and Technol., Fuzhou Univ., Fuzhou 350002, China
  • [ 3 ] [Luo, Z.-Z.]Pen Tung Sah MEMS Res. Ctr., Xiamen Univ., Xiamen 361005, China
  • [ 4 ] [Wu, Q.-X.]Dept. of Electron. Sci. and Technol., Fuzhou Univ., Fuzhou 350002, China

Reprint 's Address:

  • [Chen, G.-H.]Dept. of Electron. Sci. and Technol., Fuzhou Univ., Fuzhou 350002, China

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Source :

Journal of Functional Materials

ISSN: 1001-9731

Year: 2005

Issue: 3

Volume: 36

Page: 431-433,440

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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