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Source :
测试技术学报
ISSN: 1671-7449
CN: 14-1301/TP
Year: 1998
Issue: 002
Volume: 012
Page: 218-223
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 2
Affiliated Colleges: