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author:

吴万国 (吴万国.) [1]

Abstract:

本文叙述“晶粒度和点阵畸变”的测量原理,讨论了日本国理学电机公司该应用软件(VER4.20)中存在的问题及其对测试结果的影响.

Keyword:

X-射线 晶粒度 点阵畸变 软件

Community:

  • [ 1 ] 福州大学物理系

Reprint 's Address:

  • 吴万国

Email:

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Source :

福州大学学报(自然科学版)

ISSN: 1000-2243

CN: 35-1337/N

Year: 1991

Issue: 01

Page: 106-109

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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