• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Huang, Yifan (Huang, Yifan.) [1] (Scholars:黄奕钒) | Xu, Qifeng (Xu, Qifeng.) [2] | Xie, Nan (Xie, Nan.) [3] (Scholars:谢楠) | Liu, Lijun (Liu, Lijun.) [4] (Scholars:刘丽军)

Indexed by:

EI SCIE

Abstract:

There are some significant defects in the existing optical current transducers (OCTs), such as optical power dependence, non-linear demodulation with Malus law, linear birefringence, etc. These defects severely hurt the reliability, stability, and accuracy of OCTs in long-term applications. The main idea to become free of these defects is to have a linear sense of the Faraday rotation angle. To this end, the paper presents a linear OCT based on a strip aluminum polarization grating, which directly converts the Faraday rotation angle into a synchronous line movement of a light spot. It then positions the spot to measure the current. It has no optical power dependence, realizes a linear sense of the Faraday rotation angle, reduces the effect of temperature drift, almost eliminates linear birefringence, improves long-term stability, and achieves a 0.2S class accuracy.

Keyword:

Aluminum Faraday effect Faraday rotation angle Gratings linear measurement Nonlinear optics Optical current transducer Optical polarization polarization grating Temperature measurement Temperature sensors

Community:

  • [ 1 ] [Huang, Yifan]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Peoples R China
  • [ 2 ] [Xu, Qifeng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Peoples R China
  • [ 3 ] [Xie, Nan]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Peoples R China
  • [ 4 ] [Liu, Lijun]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Peoples R China

Reprint 's Address:

  • 徐启峰

    [Xu, Qifeng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Peoples R China

Show more details

Related Keywords:

Related Article:

Source :

IEEE SENSORS JOURNAL

ISSN: 1530-437X

Year: 2021

Issue: 6

Volume: 21

Page: 7532-7540

4 . 3 2 5

JCR@2021

4 . 3 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:105

JCR Journal Grade:1

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

Online/Total:353/10024708
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1