• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Tao, Sihong (Tao, Sihong.) [1] | Zhao, Huapeng (Zhao, Huapeng.) [2] | Chen, Zhizhang David (Chen, Zhizhang David.) [3]

Indexed by:

EI SCIE

Abstract:

Near-field-based imaging methods have been widely used to construct images of complex objects. A large number of near-field samples are needed to obtain an accurate image, resulting in high implementation expenditures. By utilizing the fact that the electric field varies fast near strong sources, this paper proposes an adaptive sampling strategy to add near field sampling points near the strong sources adaptively. With the proposed strategy, the initial uniform sampling is conducted to obtain rough source data. Then the region growing method is applied to identify multiple strong sources. More sampling points are added around every strong source point to extract all the source information accurately. The experiment results demonstrate that the proposed strategy can effectively reconstruct radiation sources using significantly less time than the existing methods.

Keyword:

Adaptive sampling strategy Imaging Load modeling Mathematical model near-field-based imaging near-field samples Noise measurement Permittivity Pins Probes region growing method

Community:

  • [ 1 ] [Tao, Sihong]Univ Elect Sci & Technol China, Sch Elect Sci & Engn, Chengdu 611731, Peoples R China
  • [ 2 ] [Zhao, Huapeng]Univ Elect Sci & Technol China, Sch Elect Sci & Engn, Chengdu 611731, Peoples R China
  • [ 3 ] [Chen, Zhizhang David]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China
  • [ 4 ] [Chen, Zhizhang David]Dalhousie Univ, Dept Elect & Comp Engn, Halifax, NS B3H 4R2, Canada

Reprint 's Address:

  • 陈志璋

    [Tao, Sihong]Univ Elect Sci & Technol China, Sch Elect Sci & Engn, Chengdu 611731, Peoples R China;;[Chen, Zhizhang David]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China;;[Chen, Zhizhang David]Dalhousie Univ, Dept Elect & Comp Engn, Halifax, NS B3H 4R2, Canada

Show more details

Related Keywords:

Source :

IEEE ACCESS

ISSN: 2169-3536

Year: 2021

Volume: 9

Page: 9550-9556

3 . 4 7 6

JCR@2021

3 . 4 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:105

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 7

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Online/Total:327/10053795
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1