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author:

Yao, Haizi (Yao, Haizi.) [1] | Mei, Hongying (Mei, Hongying.) [2] | Zhang, Weiwei (Zhang, Weiwei.) [3] | Zhong, Shuncong (Zhong, Shuncong.) [4] | Wang, Xiangfeng (Wang, Xiangfeng.) [5]

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EI

Abstract:

A terahertz metamaterial refractive index/thickness sensor with flexible substrate, exhibiting low-frequency Fano resonance and high-frequency electromagnetically induced transparent (EIT) resonance, is proposed. The physical formation mechanisms of Fano and EIT resonances are investigated by calculating the electromagnetic field. Simulated results demonstrate that the refractive index sensing sensitivity based these two resonances are up to 60 and 100 GHz/RIU, and the thickness sensing sensitivity are up to 1 and 1.7 GHz/μm, respectively. Furthermore, the proposed sensor was fabricated using femtosecond laser etching technology, and its sensing performance was verified by the experimental results that it can distinguish different liquids and detect the polyimide film with different thicknesses less than 180 μm. The remarkable performances make the proposed metamaterial sensor has feasible capability for biological and chemical sensing in terahertz range. © 2009-2012 IEEE.

Keyword:

Chemical sensors Electromagnetic fields Metamaterials Natural frequencies Refractive index Substrates Thickness measurement

Community:

  • [ 1 ] [Yao, Haizi]School of Energy Engineering, Huanghuai University, Zhumadian; Henan, China
  • [ 2 ] [Mei, Hongying]School of Information Engineering, Huanghuai University, Zhumadian; Henan, China
  • [ 3 ] [Zhang, Weiwei]School of Mathematics and Physics, Hebei GEO University, Shijiazhuang; Hebei, China
  • [ 4 ] [Zhong, Shuncong]Optical/THz and Nondestructive Testing Laboratory, School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; Fujian, China
  • [ 5 ] [Wang, Xiangfeng]Optical/THz and Nondestructive Testing Laboratory, School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; Fujian, China

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Source :

IEEE Photonics Journal

Year: 2022

Issue: 1

Volume: 14

2 . 4

JCR@2022

2 . 1 0 0

JCR@2023

ESI HC Threshold:55

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 27

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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