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author:

Nsengiyumva, Walter (Nsengiyumva, Walter.) [1] | Zhong, Shuncong (Zhong, Shuncong.) [2] (Scholars:钟舜聪) | Wang, Bing (Wang, Bing.) [3] (Scholars:王冰) | Zheng, Longhui (Zheng, Longhui.) [4] | Zhang, Zhenhao (Zhang, Zhenhao.) [5] | Zhang, Qiukun (Zhang, Qiukun.) [6] (Scholars:张秋坤) | Zhong, Jianfeng (Zhong, Jianfeng.) [7] (Scholars:钟剑锋) | Luo, Manting (Luo, Manting.) [8] | Peng, Zhike (Peng, Zhike.) [9]

Indexed by:

EI SCIE

Abstract:

Researchers and engineers are constantly developing novel techniques to accurately measure the electromagnetic properties of electrical insulators. These properties provide useful information about the insulators' performance and aging degree, which may help users to take necessary actions to prevent potential risks to the safety and stability of electric power systems. In this study, terahertz (THz) time-domain spectroscopy (THz-TDS) is used to analyze the spectral absorption and dielectric dispersion of five electrical insulation materials viz. epoxy resin (PER), E-glass fiber-reinforced polymer-matrix composite (GFRP), cross-linked polyethylene ()LPE), electrical porcelain (E-PRL), and high temperature vulcanized silicone rubber (HTVSR), in the THz frequency range (0.1 THz-1.8 THz). The refractive index, absorption coefficient, and complex relative permittivity of each sample are experimentally measured using the THz-TDS system and theoretically calculated using the original Debye model (i.e., based on the relaxation process of the individual samples' dipoles). Experimental and theoretical results of the refractive indices and dielectric constants of the individual samples are highly correlated with 0.22% and 0.17% aggregate maximum errors, respectively. The values of dielectric constants and imaginary permittivities are found to be the highest and the lowest for E-PRL and )LPE, respectively. In terms of dielectric performance, )LPE exhibits the highest and most stable dielectric performance, followed by the E-PRL, whereas PER, HTVSR, and GFRP exhibit fluctuating and slightly less stable dielectric performance. This study shows the great potential of THz nondestructive testing (NDT) and structural health monitoring (SHM) for the defect detection and service life prediction of electrical insulators.

Keyword:

Debye relaxat i o n model Dielectric properties Electrical insulat i o n materials (EIMs) Optical properties Terahertz time-domain spectroscopy (THz-TDS)

Community:

  • [ 1 ] [Nsengiyumva, Walter]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Int, Fuzhou 350116, Peoples R China
  • [ 2 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Int, Fuzhou 350116, Peoples R China
  • [ 3 ] [Wang, Bing]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Int, Fuzhou 350116, Peoples R China
  • [ 4 ] [Zhang, Zhenhao]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Int, Fuzhou 350116, Peoples R China
  • [ 5 ] [Zhang, Qiukun]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Int, Fuzhou 350116, Peoples R China
  • [ 6 ] [Zhong, Jianfeng]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Int, Fuzhou 350116, Peoples R China
  • [ 7 ] [Zheng, Longhui]Chinese Acad Sci, Fujian Inst Res Struct Matter, CAS Key Lab Design & Assembly Funct Nanostruct, Fujian Key Lab Nanomat, Fuzhou 350002, Peoples R China
  • [ 8 ] [Luo, Manting]Putian Univ, Sch Mech Elect & Informat Engn, Putian 351100, Peoples R China
  • [ 9 ] [Peng, Zhike]Ningxia Univ, Sch Mech Engn, Yinchuan 750000, Peoples R China

Reprint 's Address:

  • 钟舜聪

    [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Int, Fuzhou 350116, Peoples R China

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Source :

OPTICAL MATERIALS

ISSN: 0925-3467

Year: 2022

Volume: 123

3 . 9

JCR@2022

3 . 8 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:91

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 27

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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