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author:

Lingom, P.M. (Lingom, P.M..) [1] | Song-Manguelle, Joseph (Song-Manguelle, Joseph.) [2] | Doumbia, M.L. (Doumbia, M.L..) [3] | Flesch, Rodolfo (Flesch, Rodolfo.) [4] | Jin, Tao (Jin, Tao.) [5]

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EI

Abstract:

This article proposes a high-level engineering guide to develop an integrated system model for power quality analysis in electrical submersible pump (ESP) applications with variable frequency drives (VFDs). Such analyses are troublesome in the industry due to the complexity of these systems. In this article, simple steps to perform system integration analyses of such arrangements, including torsional analysis, are developed. A simplified VFD-ESP model suitable for coupled electrical and mechanical analysis in steady state is proposed in all their configurations of practical interest. Such a model can be easily implemented in common simulation software, significantly reducing engineering efforts for implementation and analysis. The focus of the proposed model is the prediction of ESP failures that might result from a poor power quality caused by VFDs. Analytical expressions of different types of harmonics in these systems, as well as their accurate locations in the frequency domain, including their interharmonics and common-mode harmonics, are derived for this purpose. The effectiveness of the proposed model is verified through offline and real-time hybrid simulation results. Finally, a comparison between simulation results obtained using the proposed model and measurements collected on a down-scale laboratory prototype is carried out to demonstrate the accuracy of the suggested modeling approach. © 1986-2012 IEEE.

Keyword:

Circuit simulation Computer software Frequency domain analysis Harmonic analysis Natural frequencies Power quality Quality control Submersible pumps Submersibles Timing circuits Variable speed drives

Community:

  • [ 1 ] [Lingom, P.M.]Department of Electrical Engineering, Fuzhou University, Fuzhou, China
  • [ 2 ] [Song-Manguelle, Joseph]National Transportation Research Center, Oak Ridge National Laboratory, Knoxville; TN, United States
  • [ 3 ] [Doumbia, M.L.]Department of Electrical and Computer Engineering, University of Quebec, Trois-Rivieres; QC, Canada
  • [ 4 ] [Flesch, Rodolfo]Department of Automation and Systems, Federal University of Santa Catarina, Santa Catarina, Brazil
  • [ 5 ] [Jin, Tao]Department of Electrical Engineering, Fuzhou University, Fuzhou, China

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Source :

IEEE Transactions on Power Electronics

ISSN: 0885-8993

Year: 2022

Issue: 6

Volume: 37

Page: 7039-7054

6 . 7

JCR@2022

6 . 6 0 0

JCR@2023

ESI HC Threshold:66

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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