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author:

Zhang, Jingwei (Zhang, Jingwei.) [1] (Scholars:张经伟) | Guo, Zijian (Guo, Zijian.) [2] | Liu, Kanglin (Liu, Kanglin.) [3] (Scholars:刘康林)

Indexed by:

EI Scopus SCIE

Abstract:

The small punch test (SPT) can be very convenient to obtain mechanical properties due to its unique advantages from small-volume samples, and has gained wide popularity and appreciation among researchers. In this paper, the SPT test and finite element (FE) simulations were performed for three alloys, and the yield stresses (sigma(YS)) and ultimate tensile strengths (sigma(UTS)) from the uniaxial tensile test (UTT) were correlated with the yield force (F-y) and maximum force (F-m) of the small punch test (SPT) before and after compliance calibration. Finally, the effect of specimen size on the SPT curves was discussed. The results showed that the deviation between SPT test and FE simulation was due to the loading system stiffness, which was confirmed by the loading system compliance calibration test. The SPT curves before and after calibration have less influence on the empirical correlation results for sigma(UTS), while the correlation results for sigma(YS) depend on the method used to determine F-y in the SPT curve. Finally, the simulation results indicated that the effect of specimen size on the force-displacement curve in the SPT is slight. This work also provides a reference for subsequent researchers to conduct empirical correlation studies using different specimen sizes.

Keyword:

compliance calibration finite element simulation material properties small punch test specimen size

Community:

  • [ 1 ] [Zhang, Jingwei]Fuzhou Univ, Coll Chem Engn, Fuzhou 350108, Peoples R China
  • [ 2 ] [Guo, Zijian]Fuzhou Univ, Coll Chem Engn, Fuzhou 350108, Peoples R China
  • [ 3 ] [Liu, Kanglin]Fuzhou Univ, Coll Chem Engn, Fuzhou 350108, Peoples R China

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Source :

MATERIALS

ISSN: 1996-1944

Year: 2022

Issue: 19

Volume: 15

3 . 4

JCR@2022

3 . 1 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:91

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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